WebIONTOF is a manufacturer of innovative instruments for surface analysis with different product lines for time-of-flight secondary ion mass spectrometry (TOF-SIMS) and high-sensitivity low-energy ion scattering (LEIS). Web1 feb. 2016 · IONTOF on LEIS. 3-7 In our March, 2014 article we included in-formation on suppression of backside reflections in spectroscop-ic ellipsometry from a paper by Ron …
The IONTOF products - LEIS (low energy ion scattering). Ion beam ...
Web25 mei 2024 · IONTOF GmbH 626 followers on LinkedIn. Advanced Ion Beam Technology for Surface Analysis. Innovative Ion Beam Technology for Surface Analysis IONTOF is … WebThe LEIS workshop 2024 will be held on the 4th of May in Wiener Neustadt (close to Vienna) as extension of the annual Conference of Applied Surface Chemistry. Local host will be Markus Valtiner from Vienna University of Technology. For more information and registration see: leis.cest.at Past workshop locations 2014: University of Twente grace fellowship church mattoon il
Low energy ion scattering (LEIS). A practical introduction to its ...
WebIONTOF: TOF-SIMS products for time of flight secondary ion mass spectrometry and LEIS products low energy ion scattering and ion scattering spectroscopy (iss). Company for … WebLow energy ion scattering (LEIS) probes the elemental composition of the outermost atomic layer of a material and provides static depth profiles of the outer ca. 10 nm of surfaces. … c hillenga